Voltage level control circuit and semiconductor system

A semiconductor system comprising:

• a controller configured to output a test enable signal;
• a temperature sensor configured to detect an internal temperature and to generate a temperature detection voltage;
• and
• a voltage level control circuit configured to include a resistor group, the resistor group including resistors connected in series and having integer multiples of resistances, to generate a reference voltage, the reference voltage voltage-divided from a power supply voltage by a resistance value of the resistor group controlled by the number of input times of the test enable signal to the voltage level control circuit, and to compare the temperature detection voltage with the reference voltage to generate a temperature voltage.

A voltage level control circuit comprising:

• a reference voltage generation unit configured to include a resistor group, the resistor group including resistors connected in series and having integer multiples of resistances, and to generate a reference voltage, the reference voltage voltage-divided from a power supply voltage by a resistance value of the resistor group controlled according to a combination of first and second test mode signals;
• a data input/output unit configured to compare the data with the reference voltage and to generate internal data;
• and
• an internal circuit configured to be supplied with the reference voltage, to be driven, and to store the internal data.