Composition for forming a resist underlayer film, and pattern-forming method
AssigneeJsr Corporation
InventorsFumihiro TOYOKAWA, Shin-ya NAKAFUJI, Gouji WAKAMATSU
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AssigneeJsr Corporation
InventorsFumihiro TOYOKAWA, Shin-ya NAKAFUJI, Gouji WAKAMATSU
Estimating the term…
A composition for forming a resist underlayer film is provided, which contains: a calixarene-based compound obtained from a calixarene by substituting at least a part of hydrogen atoms each on phenolic hydroxyl groups comprised in the calixarene, with a monovalent organic group having 1 to 30 carbon atoms; and an organic solvent. The monovalent organic group preferably includes a crosslinkable group. A part of hydrogen atoms each on phenolic hydroxyl groups of the calixarene-based compound is preferably substituted. The ratio of the number of substituted phenolic hydroxyl groups to the number of unsubstituted phenolic hydroxyl groups in the calixarene-based compound is preferably no less than 30/70 and no greater than 99/1.
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