Tester for integrated circuits on a silicon wafer and integrated circuit

A test method, using a tester of integrated circuits on a silicon wafer, the tester comprising a single input/output connection for testing an integrated circuit, wherein said method causes the tester to perform:

• transferring a data frame to the integrated circuit via the input/output connection, the data frame comprising a time reference for the data included in the data frame, a field for validating the time reference and a data field comprising at least one command for testing the integrated circuit;
• and
• receiving a data frame via the input/output connection, the data in the data frame received having a duration equal to an integer number that is a multiple of the time reference and greater than or equal to twice the duration of the time reference.

The method for testing an integrated circuit comprising a single input/output connection for testing the integrated circuit, wherein said method comprises:

• receiving, by the integrated circuit, a data frame via the input/output connection, the data frame comprising a time reference for the data included in the data frame, a field for validating the time reference and a data field comprising at least one command for testing the integrated circuit,
• transferring, by the integrated circuit, a data frame via the input/output connection, the data in the data frame transferred having a duration equal to an integer number that is a multiple of twice the duration of the time reference.