US 2016/0258892 A1Published application

Quantitative X-ray Analysis - Multi optical path instrument

AssigneePANalytical B.V.

InventorsPetronella Emerentiana Hegeman, Gustaaf Christian Brons, Aleksandr Komelkov, Bruno A.R. Vrebos, Waltherus Van Den Hoogenhof, Charalampos Zarkadas

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Abstract

Apparatus includes an X-ray source 10, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detector 14 again for measuring X-ray fluoresence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.

Claims20

Dependent claims

A method of quantitative X-ray fluorescence, XRF, analysis of a sample of a specified type to measure the concentration of a plurality of elements in respective concentration ranges, the method comprising:

carrying out energy dispersive XRF, ED-XRF, to measure the concentration of a selected first subset of the predetermined elements;
carrying out wavelength dispersive XRF, WD-XRF, to measure the concentration of a selected second sub-set of the elements;
wherein the elements are divided between the first and second subsets according to a criterion to deliver a reduced overall measurement time to measure all the plurality of elements to a given precision and/or accuracy compared to using only one of the energy dispersive XRF and the wavelength dispersive XRF.

Dependencies are inferred from the claim text.

Facts

Application: 14/637,833Filed 4 Mar 2015
Priority: 3 Mar 2015
Published: 8 Sep 2016
Term ends: Not estimatedThe source records don’t support an estimate.

Classification2 codes

G01N 23/223
By measuring secondary emission from the material: by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N
Investigating or analysing materials by determining their chemical or physical properties

Family

Application62/127,591Us provisional application · filed 3 Mar 2015
US 9,739,730 B2Related patent
US 2016/0258892 A1This patent

From the US filing history. Foreign family members aren’t listed.

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