Nitride semiconductor
AssigneeSharp Kabushiki Kaisha
InventorsYushi INOUE, Atsushi OGAWA, Nobuyuki ITO, Nobuaki TERAGUCHI
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AssigneeSharp Kabushiki Kaisha
InventorsYushi INOUE, Atsushi OGAWA, Nobuyuki ITO, Nobuaki TERAGUCHI
Estimating the term…
According to this GaN-based HFET, resistivity ρ of a semi-insulating film forming a gate insulating film is 3.9×109 Ωcm. The value of this resistivity ρ is a value derived when the current density is 6.25×10−4 (A/cm2). By inclusion of the gate insulating film by a semi-insulating film having a resistivity ρ=3.9×109 Ωcm, a withstand voltage of 1000 V can be obtained. Meanwhile, the withstand voltage abruptly drops as the resistivity of the gate insulating film exceeds 1×1011 Ωcm, and the gate leak current increases when the resistivity of the gate insulating film drops below 1×107 Ωcm.
A nitride semiconductor comprising:
Dependencies are inferred from the claim text.