Testing front end modules, testing methods and modular testing systems for testing electronic equipment

A testing method for testing a plurality of devices under test (DUT), the method comprising:

• generating testing signals in a testing front end module;
• splitting the generated testing signals and transmitting the split testing signals from the testing front end module to a plurality of DUTs;
• receiving testing response signals upon the split testing signals from each of the plurality of DUTs by the testing front end module;
• transmitting the received testing response signals from the testing front end module to a remote controller via a wired data connection between the remote controller and the testing front end module;
• and
• evaluating the testing response signals in the remote controller.

A testing front end module for testing a plurality of devices under test (DUT), the testing front end module comprising:

• a testing signal interface;
• a vector signal generator (VSG) coupled to the testing signal interface and configured to generate testing signals upon reception of testing routine signals from a remote controller via the testing signal interface;
• a vector signal analyser (VSA) coupled to the testing signal interface and configured to receive testing response signals from a plurality of DUTs and to transmit the received testing response signals to the remote controller via the testing signal interface;
• a multiplexer/demultiplexer (MUX/DEMUX) coupled to the VSG and the VSA, the MUX/DEMUX being configured to multiplex the received testing response signals and to demultiplex the generated testing signals;
• and
• a test device interface coupled to the MUX/DEMUX and configured to couple the testing front end module to the plurality of DUTs.

A testing system for testing a plurality of devices under test (DUT), the testing system comprising:

• a controller;
• and
• a testing front end module, the testing front end module comprising:
• a testing signal interface;
• a vector signal generator (VSG) coupled to the testing signal interface and configured to generate testing signals upon reception of testing routine signals from the controller via the testing signal interface;
• a vector signal analyser (VSA) coupled to the testing signal interface and configured to receive testing response signals from a plurality of DUTs and to transmit the received testing response signals to the controller via the testing signal interface;
• a multiplexer/demultiplexer (MUX/DEMUX) coupled to the VSG and the VSA, the MUX/DEMUX being configured to multiplex the received testing response signals and to demultiplex the generated testing signals;
• and
• a test device interface coupled to the MUX/DEMUX and configured to couple the testing front end module to the plurality of DUTs,
• wherein the controller is coupled to the testing signal interface of the testing front end module via a wired data connection.