Error detection circuit and semiconductor apparatus using the same

A semiconductor apparatus comprising:

• a memory block;
• an input data processing unit configured to align external data according to an input control clock signal and generate alignment data;
• and
• an error detection circuit configured to sequentially perform a primary error detection operation on a primary data group and a secondary data group of the external data, perform a secondary error detection operation on results of the primary error detection operation, and generate an error detection signal for determining a presence or an absence of an error of the external data.

An error detection circuit comprising:

• a selection unit configured to select one of a primary data group and a secondary data group according to a first control signal and to generate an output signal;
• a first operation unit configured to receive the output signal and perform an error detection operation and generate a preliminary error operation signal;
• a storage unit configured to output a latch signal by latching the preliminary error operation signal according to a second control signal;
• a second operation unit configured to perform an error detection operation on the latch signal and the preliminary error operation signal and output an internal error operation signal;
• and
• a comparison unit configured to compare the internal error operation signal to an external error operation signal and output an error detection signal.