Improvements in or relating to super-resolution microscopy

Abstract

The present invention relates to a method of processing images captured following structured illumination of a sample, the method comprising the steps of: identifying emission spots within each captured image; verifying the emission spots; and reconstructing an enhanced image of the sample from the emission spots. The method may comprise identifying only in focus emission spots. By identifying and processing only in focus spots, whether or not they are centred on expected illumination positions, improvements in resolution can be achieved compared to known SIM methods. In particular, by suitable selection of in focus spots, significant improvements in lateral and axial resolution can be achieved.

Dependencies are inferred from the claim text.