Tester
AssigneeAdvantest Corporation
InventorGiovanni Bianchi
Life of this patent
Estimating the term…
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AssigneeAdvantest Corporation
InventorGiovanni Bianchi
Estimating the term…
A tester including a source and measuring device and a TX port connected to the source and measuring device is provided. The tester is configured to determine a source reflection coefficient using an extension circuit. The extension circuit includes a TX port connectable to the source and measuring device, a termination switch and a calibration device providing one or more terminations, wherein each of the terminations is individually connectable to the TX port by the termination switch, wherein one of the terminations is a power sensor. The source and measuring device is configured to measure one or more reflection coefficients at the TX port for the one or more terminations provided by the calibration device including the reflection coefficient for the power sensor. The tester is configured to determine the source reflection coefficient based on the one or more measured reflection coefficients including the measured reflection coefficient for the power sensor.
An apparatus, comprising:
A system, comprising:
A method of determining a source reflection coefficient, the method comprising:
Dependencies are inferred from the claim text.