Test assembly and method of manufacturing the same

A method of manufacturing a test assembly, comprising:

• disposing an adhesive element on a first surface of a space transformer;
• forming a plurality of through holes in the adhesive element;
• attaching an intermediary supporting element to the first surface of the space transformer through the adhesive element;
• disposing each of a plurality of electrical connection elements in one of a plurality of through holes of the intermediary supporting element and one of the through holes of the adhesive element such that each of the electrical connection elements penetrates the intermediary supporting element and the adhesive element;
• disposing the space transformer, the intermediary supporting element and the electrical connection elements which have been assembled on a main circuit board such that the first surface faces the main circuit board and the space transformer is electrically connected to the main circuit board through the electrical connection elements;
• and
• disposing the test probes on a second surface of the space transformer opposite of the first surface such that the test probes are electrically connected to the space transformer.

A method of manufacturing a test assembly, comprising:

• disposing an adhesive element on an intermediary supporting element;
• forming a plurality of through holes in the adhesive element;
• attaching a first surface of a space transformer to the intermediary supporting element through the adhesive element;
• disposing each of a plurality of electrical connection elements in one of a plurality of through holes of the intermediary supporting element and one of the through holes of the adhesive element such that each of the electrical connection elements penetrates the intermediary supporting element and the adhesive element;
• disposing the space transformer, the intermediary supporting element and the electrical connection elements which have been assembled on a main circuit board such that the first surface faces the main circuit board and the space transformer is electrically connected to the main circuit board through the electrical connection elements;
• disposing the test probes on a second surface of the space transformer opposite of the first surface such that the test probes are electrically connected to the space transformer.