Probe pin and method for producing a probe pin

A method for producing a probe pin for electronic testing of semi-conductor elements, wherein the probe pin comprises an electrically conductive core element comprising a metallic alloy and an electrically insulating jacket element, wherein the jacket element surrounds the core element over regions thereof and the core element comprises a distal contact section for electrical contacting the probe pin with a semi-conductor element, the method comprising the steps of:

• a. providing a cylinder-like pre-mold comprising the metallic alloy forming the core element, wherein the metallic alloy comprises at least 67% by weight rhodium;
• 0.1% by weight to 1% by weight zirconium;
• up to 1% by weight yttrium;
• and up to 1% by weight cerium;
• b. drawing the pre-mold into a wire;
• c. subdividing the wire into wire-sections to provide the electrically conductive core element of the probe pin;
• d. applying the electrically insulating jacket element onto the core element;
• and
• e. providing a cone-like distal contact section of the core element.