Array based sample characterization
AssigneeMalvern Instruments Limited
InventorE. Neil LEWIS
Life of this patent
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Abstract
An optical sample characterization method is disclosed comprising: holding a sample in a sample container proximate at least one two-dimensional detector array assembly, wherein the sample container has a first end and a second end; setting up a gradient between the first end of the sample container and the second end of the sample container; illuminating the sample between the first end of the sample container and the second end of the sample container; and detecting light received from the illuminated sample from the first end of the sample container to the second end of the sample container by the two-dimensional array assembly.
Claims27
1-15. (canceled)
1-12. (canceled)
1-17. (canceled)
1-6. (canceled)
1-27. (canceled)
28-62. (canceled)
An optical sample characterization device, comprising:
- a sample holder,
- a first illumination source positioned to illuminate a sample in the sample holder,
- a second illumination source positioned to illuminate the sample in the sample holder,
- a first two-dimensional detector array positioned to detect light from the second illumination source that is transmitted through the sample, and
- a second two-dimensional detector array positioned to detect light scattered by the sample from the first illumination source.
Dependencies are inferred from the claim text.