System and method for identifying operating temperatures and modifying of integrated circuits

A system for identifying an operating temperature of an integrated circuit (IC), the system comprising:

• a test circuit embedded within the IC, the test circuit including a phase shift memory (PSM) element therein, wherein the PSM element crystallizes at a crystallization temperature from an amorphous phase having a first electrical resistance into a crystalline phase having a second electrical resistance, the second electrical resistance being less than the first electrical resistance;
• and
• a controller electrically connected to the test circuit and configured to perform actions including:
• determining a resistance of the test circuit;
• comparing the resistance of the test circuit with a target operating range, and
• identifying the IC as having operated above the crystallization temperature in response to the resistance of the test circuit being outside of the target operating range.