Dual-Function Switch and Lead Set for Electrical Instrument Probes

Abstract

For decades, a mainstay of electrical and electronic testing has been the conventional use of the multi-meter that used a pair of probes to connect the Device Under Test to the meter. This often proves inadequate for present-day testing because more than one simultaneous or alternate reading or the connection of another testing tool and the reading of its effect on the DUT is often required. The Dual-Function Switch and Lead set (DFSL) of the present invention provides a switch and lead set interfacing two multi-meters, or one multi-meter and one test device or instrument with the DUT, while using the traditional and convenient pair of probes and a simple finger movement on the DFSL. The DFSL facilitates these tests, their safety and integrity, and reduces the time of many test procedures.

Dependencies are inferred from the claim text.