Systems for and methods of characterizing the thickness profile of laminated glass structures

A system for characterizing a thickness profile of a laminated glass structure having a body comprising multiple layers, the system comprising:

• a laser configured to emit laser light;
• a light-focusing system configured to focus the laser light on a micro-volume within the body to cause fluorescent light to emanate from the micro-volume, the light-focusing system comprising a double-cladding optical fiber comprising a core and an inner cladding and configured to carry the laser light within one of the core or the inner cladding and carry the fluorescent light in the other of the core or the inner cladding;
• a photodetector configured to detect an intensity of the fluorescent light and generate a detector signal representative of the detected intensity;
• and
• a controller configured to determine relative locations of the multiple layers based on the detector signal.

A system for characterizing a thickness profile of a laminated glass structure having a body comprising multiple layers, the system comprising:

• a laser configured to emit laser light;
• a light-focusing system configured to focus the laser light on a micro-volume within the body to cause fluorescent light to emanate from the micro-volume;
• a photodetector configured to detect an intensity of the fluorescent light and generate a detector signal representative of the detected intensity;
• and
• a controller configured to determine relative locations of the multiple layers to a resolution R in a range of 0.5 micron to 5 microns based on the detector signal.