In Situ on the Fly On-Chip Variation Measurement

A methodology for integrated circuit design, comprising:

• providing a first electronic design file for an integrated circuit having a timing measurement circuit thereon;
• based on the first electronic design file, manufacturing a plurality of integrated circuits having respective timing measurement circuits arranged at predetermined locations on the respective integrated circuits;
• using the plurality of timing measurement circuits to measure a plurality of timing delay values, respectively, on the plurality of manufactured integrated circuits, respectively;
• and
• using the measured timing delay values to set how an auto-place and route tool arranges blocks in a second electronic design file, which is routed after the plurality of timing delays are measured, to account for measured manufacturing variation.

A time to current converter, comprising:

• first and second input terminals between which first and second signals whose edges exhibit a timing delay value are to be applied;
• a clock input terminal on which a clock signal is to be received;
• first logic circuitry to provide a first output current signal whose width represents an overlap between the clock signal and the first signal;
• and
• second logic circuitry to provide a second output current signals whose width represents an overlap between the clock signal and the second signal;
• and
• analysis circuitry to compare the first and second output current signals to determine the timing delay value between the edges of the first and second signals.