High resolution eddy current array probe
AssigneeEddyfi Ndt Inc.
InventorsFlorian Hardy, Marc Grenier
Life of this patent
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AssigneeEddyfi Ndt Inc.
InventorsFlorian Hardy, Marc Grenier
Estimating the term…
An eddy current array probe comprising a probe body adapted to be displaced along a scan direction; a plurality of coils arranged in a linear configuration on the surface of the probe body, the coils being adapted to be operated in one mode among a transmit mode, an inactive mode and a receive mode at each of a plurality of time-spaced instances, at least two adjacent coils of the plurality being adapted to be operated in the inactive mode between a coil adapted to be in transmit mode and a coil adapted to be in receive mode in the linear configuration at each of the time-spaced instances; at least one conductor extending from the probe body; each coil of the plurality being connected to one of the at least one conductor and a common return path. In one embodiment, the coils have an elongated shape.
An eddy current array probe, comprising:
A method for generating inspection data about an electrically conductive material to be tested using an eddy current array probe, comprising:
Dependencies are inferred from the claim text.