Height measuring apparatus and method thereof
AssigneeWistron Corporation
InventorsYao-Tsung CHANG, Chia-Hsien LI, Pai-Yang LIN, Shun-Chi CHUNG
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AssigneeWistron Corporation
InventorsYao-Tsung CHANG, Chia-Hsien LI, Pai-Yang LIN, Shun-Chi CHUNG
Estimating the term…
A height measuring apparatus and a method thereof are disclosed. The disclosed method is suitable for an indoor environment. The disclosed method comprises emitting a first laser to a ceil via a first light path, determining whether a first reflective light corresponding to the first laser is received, emitting a second laser to an object via a second light path reflected by the ceil, determining whether a second reflective light corresponding to the second laser is received, calculating a first length according to a first data corresponding to the first reflective light, calculating a second length according to a second data corresponding to the second reflective light, and calculating an object height of the object according to the first length and the second length.
A method for measuring height applicable for an environment with a first reflecting surface, the method comprises:
A height measuring apparatus applicable for an environment with a first reflecting surface, the apparatus comprising:
Dependencies are inferred from the claim text.