Defect management policies for nand flash memory
AssigneeIntel Corporation
InventorsPranav Kalavade, Feng Zhu, Shyam Sunder Raghunathan, Ravi H. Motwani
Life of this patent
Estimating the term…
Loading patent…
AssigneeIntel Corporation
InventorsPranav Kalavade, Feng Zhu, Shyam Sunder Raghunathan, Ravi H. Motwani
Estimating the term…
Systems and methods of managing defects in nonvolatile storage systems that can be used to avoid an inadvertent loss of data, while maintaining as much useful memory in the nonvolatile storage systems as possible. The disclosed systems and methods can monitor a plurality of trigger events for detecting possible defects in one or more nonvolatile memory (NVM) devices included in the nonvolatile storage systems, and apply one or more defect management policies to the respective NVM devices based on the types of trigger events that resulted in detection of the possible defects. Such defect management policies can be used proactively to retire memory in the nonvolatile storage systems with increased granularity, focusing the retirement of memory on regions of nonvolatile memory that are likely to contain a defect.
A method of managing defects in a nonvolatile storage system, the nonvolatile storage system including one or more nonvolatile memory (NVM) devices, the method comprising:
A nonvolatile storage system, comprising:
A nonvolatile storage system including one or more nonvolatile memory (NVM) devices, the system comprising:
A computer-readable storage medium including executable instructions for accessing data storable within a non-volatile memory (NVM) device in a computer system, the computer system including at least one processor, the computer-readable storage medium comprising executable instructions:
Dependencies are inferred from the claim text.