Back to results
US 2015/0146959 A1Published application
Method to evaluate the presence of a source of x-ray beam inhomogeneity during x-ray exposure
AssigneeAgfa Healthcare NV
InventorsMarc Cresens, Herman Van Goubergen
Life of this patent
Estimating the term…
Abstract
A statistical analysis is performed on pixel values of at least one region of interest in an image obtained by substantially uniform irradiation of an x-ray detector and deciding upon the presence of a source of x-ray beam in-homogeneity by comparing the results of the statistical analysis with at least one predetermined acceptance criterion.
Claims13
1-12. (canceled)
A method to generate gain correction data for correcting a direct radiography or computed radiography image, the method comprising the steps of:
- exposing an x-ray detector to a substantially uniform x-ray beam to generate an x-ray image;
- converting the x-ray image into a digital image representation;
- using the digital image representation for calculation of the gain correction data;
- performing a statistical analysis on pixel values of at least one region of interest in the digital image representation;
- determining a presence of a source of x-ray beam in homogeneity by comparing results of the statistical analysis with least one predetermined acceptance criterion;
- and
- using the digital image representation for the calculation of the gain correction data when it is determined in the determining step that no source of x-ray beam inhomogeneity is present.
4 more elements
Dependencies are inferred from the claim text.