Optical axis adjustment device for x-ray analyzer

An optical axis adjustment device for an X-ray analyzer comprising:

• an incident-side arm that rotates around a sample axis passing through a sample position constituting a position at which a sample is placed;
• a receiving-side arm that rotates around the sample axis and extends toward a side opposite the incident-side arm;
• an X-ray source provided on the incident-side arm;
• an incident-side slit provided on the incident-side arm between the sample position and the X-ray source;
• an X-ray detector provided on the receiving-side arm;
• a shielding strip disposed at a position blocking X-rays received by the X-ray detector from the X-ray source, and
• shielding strip-moving means for rotating the shielding strip around the sample axis relative to an optical axis of the X-rays reaching the X-ray detector from the X-ray source to two different angle positions;
• wherein an amount of deviation in parallelism of the surface of the sample with respect to the optical axis of the X-rays is found on the basis of X-ray intensity values found by the X-ray detector for each of the two angle positions.