Semiconductor device

A semiconductor device comprising:

• a first circuit;
• and
• a second circuit,
• wherein the first circuit comprises a first memory storing first data corresponding to a history of a first branch instruction of the first circuit and a first address of the first branch instruction and a comparator circuit comparing an address of an instruction and the first address, and
• wherein the second circuit comprises a second memory storing second data to generate a signal for an operation test of the first circuit, and third data corresponding to a history of a second branch instruction of the first circuit and a second address of the second branch instruction after the operation test in accordance with the signal.

A semiconductor device comprising:

• a first circuit;
• and
• a second circuit,
• wherein the first circuit comprises a first memory storing first data corresponding to a history of a first branch instruction of the first circuit and a first address of the first branch instruction, a comparator circuit comparing an address of an instruction and the first address, and a selector circuit selecting the first address in accordance with a comparison result of the comparator circuit, and
• wherein the second circuit comprises a second memory storing second data to generate a signal for an operation test of the first circuit, and third data corresponding to a history of a second branch instruction of the first circuit and a second address of the second branch instruction after the operation test in accordance with the signal.