Magnetic random access memory with perpendicular enhancement layer
AssigneeAvalanche Technology, Inc.
InventorsHuadong Gan, Yuchen Zhou, Yiming Huai, Zihui Wang, Xiaobin Wang
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AssigneeAvalanche Technology, Inc.
InventorsHuadong Gan, Yuchen Zhou, Yiming Huai, Zihui Wang, Xiaobin Wang
Estimating the term…
The present invention is directed to an MRAM element comprising a plurality of magnetic tunnel junction (MTJ) memory elements. Each of the memory elements comprises a magnetic reference layer structure, which includes a first and a second magnetic reference layers with a tantalum perpendicular enhancement layer interposed therebetween, an insulating tunnel junction layer formed adjacent to the first magnetic reference layer opposite the tantalum perpendicular enhancement layer, and a magnetic free layer formed adjacent to the insulating tunnel junction layer. The first and second magnetic reference layers have a first fixed magnetization direction substantially perpendicular to the layer planes thereof.
A magnetic random access memory device comprising a plurality of magnetic tunnel junction (MTJ) memory elements, each of said memory elements comprising:
A magnetic random access memory device comprising a plurality of magnetic tunnel junction (MTJ) memory elements, each of said memory elements comprising:
A magnetic random access memory device comprising a plurality of magnetic tunnel junction (MTJ) memory elements, each of said memory elements comprising:
Dependencies are inferred from the claim text.