Semiconductor device

A semiconductor device comprising:

• a first circuit unit;
• a reference voltage generation circuit that generates a reference voltage;
• a sampling and holding circuit of the reference voltage;
• a sampling and holding control circuit that controls the sampling and holding circuit;
• and
• a plurality of second circuit units that operate by inputting the reference voltage sampled and held by the sampling and holding circuit,
• wherein the second circuit units include a display electrode driving circuit that generates a plurality of driving voltages for driving a scanning electrode and a signal electrode for display by a driving voltage generated using the reference voltage, and
• the sampling and holding control circuit instructs the sampling and holding circuit to perform a holding operation of the reference voltage in a display period in which the scanning electrode and the signal electrode are driven, and instructs the sampling and holding circuit to perform a sampling operation of the reference voltage in a non-display period.

A semiconductor device comprising:

• a first circuit block that uses a first power supply or a power supply obtained by stepping down the first power supply;
• and
• a plurality of second circuit blocks that use a power supply having a voltage higher than that of the first power supply in absolute value,
• wherein the first circuit block includes a reference voltage generation circuit that generates a reference voltage,
• the second circuit blocks include a sampling and holding circuit of the reference voltage, and operate using a reference voltage sampled and held by their own sampling and holding circuit, and
• the first circuit block further includes a logic circuit that instructs the sampling and holding circuit to perform a holding operation of the reference voltage in an activation period of its own predetermined internal circuit, and instructs the sampling and holding circuit to perform a sampling operation of the reference voltage in a deactivation period of the internal circuit.

A semiconductor device comprising:

• a first circuit block that uses a first power supply or a power supply obtained by stepping down the first power supply;
• and
• a plurality of second circuit blocks that use a power supply having a voltage higher than that of the first power supply in absolute value,
• wherein the first circuit block includes a reference voltage generation circuit that generates a reference voltage and a sampling and holding control circuit,
• the second circuit blocks include a sampling and holding circuit of the reference voltage, and operate using a reference voltage sampled and held by their own sampling and holding circuit, and
• the sampling and holding control circuit determines whether a predetermined power supply fluctuation occurs in a power supply of the reference voltage generation circuit, instructs the sampling and holding circuit to perform the holding operation of the reference voltage in a predetermined period with respect to the fluctuation in case that the predetermined power supply fluctuation is detected, and instructs the sampling and holding circuit to perform the sampling operation of the reference voltage in case that the power supply fluctuation is not detected.