Super-Self-Aligned Contacts and Method for Making the Same
AssigneeTela Innovations, Inc.
InventorMichael C. Smayling
Life of this patent
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AssigneeTela Innovations, Inc.
InventorMichael C. Smayling
Estimating the term…
A number of first hard mask portions are formed on a dielectric layer to vertically shadow a respective one of a number of underlying gate structures. A number of second hard mask filaments are formed adjacent to each side surface of each first hard mask portion. A width of each second hard mask filament is set to define an active area contact-to-gate structure spacing. A first passage is etched between facing exposed side surfaces of a given pair of neighboring second hard mask filaments and through a depth of the semiconductor wafer to an active area. A second passage is etched through a given first hard mask portion and through a depth of the semiconductor wafer to a top surface of the underlying gate structure. An electrically conductive material is deposited within both the first and second passages to respectively form an active area contact and a gate contact.
A semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.