Systems and methods for Analog, Digital, Boundary Scan, and SPI Automatic Test Equipment

Automatic test equipment systems and methods that utilize digital tester to drive or detect DUT's BSC IC pins digital logic levels which can be detected or driven digitally by an inter-working BST which is running concurrently within the same automatic test equipment. In case that digital tester is driving, it will drive DTST pins to the test program specified digital logic levels which are directed to drive DUT's BSC IC pins. Following that, a BST test operation can be executed to capture those BSC IC pins input digital logic levels and concludes the BST test results by comparing the captured BSC IC pins input cells digital logic levels with those expected in BST test instruction. On the opposite test driving direction, BST test operation will guide DUT's BSC IC pins to drive the BST test instruction specified digital logic levels which will be directed to drive DTST pins. The digital tester operation that follows will capture DTST input pins and conclude the DTST test results by comparing returned DTST input pins digital logic levels with those expected in DTST test instruction. These inter-workings between DTST and BST can help better identifying DUT's BSC IC pins faults such as open pin or short circuit with other DUT pins.