Nonvolatile memory device including memory cell array with upper and lower word line groups
AssigneeSamsung Electronics Co., Ltd.
InventorsCHANGKYU SEOL, EUNCHEOL KIM, JUNJIN KONG, HONG RAK SON
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AssigneeSamsung Electronics Co., Ltd.
InventorsCHANGKYU SEOL, EUNCHEOL KIM, JUNJIN KONG, HONG RAK SON
Estimating the term…
A nonvolatile memory device includes a memory cell array having multiple memory blocks. Each memory block includes memory cells arranged at intersections of multiple word lines and multiple bit lines. At least one word line of the multiple word lines is included in an upper word line group and at least one other word line of the multiple word lines is included in a lower word line group. The number of data bits stored in memory cells connected to the at least one word line included in the upper word line group is different from the number of data bits stored in memory cells connected to the at least one other word line included in the lower word line group.
A memory system comprising,
The memory system of claim 7, wherein the plurality of word lines are stacked on the substrate, wherein the first word line is disposed on a lower portion of the second word line.
The memory system of claim 13, wherein a width of a lower portion of the pillar is smaller than of a width of a upper portion of the pillar.
A nonvolatile memory device comprising:
A method for operating a memory system including at least one nonvolatile memory device in a plurality of memory blocks, wherein each memory block comprises a plurality of strings in a direction perpendicular to a substrate, wherein each string includes at least one string selection transistor, a plurality of memory cells arranged in a plurality of word lines and a plurality of bit lines and at least one ground selection transistor in series and a memory controller configured to control the at least one nonvolatile memory device, the method comprising,
The method of claim 19, wherein the first and the second input data include at least one parity bit data for lowering bit error rates, further comprising the least one parity bit data.
The method of claim 20, further comprising,
Dependencies are inferred from the claim text.