High speed tester communication interface between test slice and trays

A tester system comprising:

• a tester module operable to generate test signals for testing a plurality of DUTs;
• a plurality of cables operable to communicatively couple said tester module with a tray comprising said plurality of DUTs through a thermal chamber wall interface;
• and
• a plurality of connectors in contact with said tray, wherein said plurality of connectors is operable to provide an interface between said plurality of cables and conductive traces on said tray, and further wherein each of said plurality of connectors is operable to pass a respective subset of said test signals to each DUT on said tray via said conductive traces.

A test equipment apparatus comprising:

• a tester tray comprising sockets operable to communicatively couple said tester tray with a plurality of DUTs;
• and
• a plurality of connectors in contact with said tester tray, wherein said plurality of connectors is operable to provide an interface between test signals received via cables and conductive pads on said tester tray, and wherein each of said plurality of connectors is operable to pass a respective subset of said test signals to each DUT on said tester tray via said conductive pads, and
• further wherein each connector from said plurality of connectors comprises:
• an interposer operable to communicatively couple said test signals with pads on said tray;
• a connector operable to receive said test signals through said cables;
• and
• a printed circuit board for interfacing said interposer with said connector.