Systems and methods mitigating temperature dependence of circuitry in electronic devices
AssigneeAnalog Test Engines
InventorJeffrey Allen King
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Abstract
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
Claims10
A voltage generator, comprising:
- a reference generator configured to generate a reference signal, wherein the reference signal is dependent at least in part on a control signal and on a temperature, such that a change in the reference signal in response to a change in the temperature is based partly on the control signal;
- and
- a programmable register, configured to store a changeable code value and to generate the control signal based on the code value.
A method of programming a reference generator, the reference generator configured to generate a temperature dependent reference signal, wherein the temperature dependence of the reference signal is based at least in part on a changeable code value stored in a programmable register, the method comprising:
- programming the register with each of multiple code values;
- setting the temperature to each of multiple temperature values;
- measuring the reference signal for each of a plurality of combinations of the multiple code values and the multiple temperature values;
- selecting a programming code value based on the measured reference signals;
- and
- programming the register with the programming code value.
Dependencies are inferred from the claim text.