Testing tool and testing method thereof
AssigneeWistron Corporation
InventorCongfa Wu
Life of this patent
Estimating the term…
Loading patent…
AssigneeWistron Corporation
InventorCongfa Wu
Estimating the term…
A testing tool includes a tool body, a panel imitation member disposed on the tool body, an indicating device, and a probe device. A test panel cover is detachably disposed on the tool body. The probe device is disposed in the panel imitation member and includes a probe and a conductive member disposed under the probe. The probe is elastically disposed through the panel imitation member between initial and triggering positions. When the probe is located at the initial position, the probe extends out from the panel imitation member to abut against the test panel cover. When the test panel cover is sunken inward to contact with the panel imitation member so as to drive the probe to the triggering position, the probe contacts with the conductive member to electrically conduct the indicating device.
A testing tool for testing inward deformation of a test panel cover, the testing tool comprising:
A testing method for utilizing a testing tool to test inward deformation of a test panel cover, the testing tool comprising a tool body, a panel imitation member, an indicating device, and a probe device, the panel imitation member being disposed on the tool body, the probe device comprising a probe and a conductive member, the probe being movable up and down relative to the panel imitation member and coupled to the indicating device, the conductive member being coupled to the indicating device, the testing method comprising:
Dependencies are inferred from the claim text.