Method for characterization of a surface topography
AssigneeCommissariat A L'energie Atomique Et Aux Ene Alt
InventorsCarlos BEITIA CACERES, Florent DETTONI
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AssigneeCommissariat A L'energie Atomique Et Aux Ene Alt
InventorsCarlos BEITIA CACERES, Florent DETTONI
Estimating the term…
A method for characterization of a surface topography, comprising application of the following steps: measurement of the surface topography; first fitting of data output from the measurement of the surface topography, made from an order m first equation; filter height of data output from application of the first fitting; determine the data fitting coefficients for data output from the application of filtering, from an order n second equation; second fitting of data output from application of the first fitting, made from the order n second equation and previously determined coefficients; n and m being positive integers greater than or equal to 1 and such that n≧m.
A method for characterization of a surface topography, comprising at least application of the following steps:
Dependencies are inferred from the claim text.