Method for producing transparent soi wafer
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsShoji Akiyama, Kazutoshi Nagata
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AssigneeShin-Etsu Chemical Co., Ltd.
InventorsShoji Akiyama, Kazutoshi Nagata
Estimating the term…
The method for producing a transparent SOI wafer is provided and includes treating a bonded wafer at a first temperature of 150 to 300° C. as a first heat treatment; cutting off an unbonded portion of the bonded wafer by irradiating a visible light laser from a silicon wafer side of the heated bonded wafer to a boundary between the bonded surface and an unbonded circumferential surface, while keeping an angle of 60 to 90° between the incident light and a radial direction of the silicon wafer; subjecting the silicon wafer of the bonded wafer having the unbonded portion cut off to grinding, polishing, or etching to form a silicon film; and heat-treating the bonded wafer having the silicon film formed at a second temperature of 300 to 500° C. as a second heat treatment which is higher than the first temperature.
A method for producing a transparent SOI wafer, the method comprising the steps of:
Dependencies are inferred from the claim text.