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US 2014/0232426 A1Published application
Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structure
AssigneeEssai, Inc.
InventorsNasser Barabi, Chee Wah Ho, Joven R. Tienzo, Oksana Kryachek, Elena V. Nazarov
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Abstract
A convex testing stack useful in association with a thermal control unit (TCU) that may be used to maintain a set point temperature for testing of a convex IC device under test (DUT) is configured to preserve the convex shape of the DUT.
Claims6
A convex testing stack useful in association with a thermal control unit (TCU) that may be used to maintain a set point temperature for testing of a convex IC device under test (DUT), the convex testing stack comprising:
- a substantially convex support plate assembly configured to provide support to the convex testing stack;
- a conforming motherboard configured to take a convex shape when operatively coupled to the convex testing stack;
- and
- a conforming socket assembly configured to take a convex shape when operatively coupled to the conforming motherboard.
1 more element
Dependencies are inferred from the claim text.