System and method for detecting target materials using a vis-nir detector
AssigneeChemlmage Corporation
InventorsMatthew NELSON, Patrick TREADO, Charles GARDNER, Andrew BASTA
Life of this patent
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AssigneeChemlmage Corporation
InventorsMatthew NELSON, Patrick TREADO, Charles GARDNER, Andrew BASTA
Estimating the term…
The present disclosure provides systems and methods for determining the presence of a target material in a sample. In general terms, the system and method disclosed herein provide collecting interacted photons from a sample having a target material. The interacted photons are passed through a tunable filter to a VIS-NIR detector where the VIS-NIR detector generates a VIS-NIR hyperspectral image representative of the filtered interacted photons. The hyperspectral image of the filtered interacted photons is analyzed by comparing the hyperspectral image of the filtered interacted phtons to known hyperspectral images to identify the presence of a target material in a sample. The systems and methods disclosed herein provide easy identification of the presence of a target material in a sample.
A system for identifying a target material in a sample, the system comprising:
A method for identifying a target material in a sample, the method comprising:
A system for identifying an target material in a sample, the system comprising:
Dependencies are inferred from the claim text.