Apparatus for collecting material to be spectrally analyzed
AssigneeHewlett-Packard Development Company, L.P.
InventorsShih-Yuan Wang, Huei Pei Kuo, Zhiyong Li, Gary Gibson
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AssigneeHewlett-Packard Development Company, L.P.
InventorsShih-Yuan Wang, Huei Pei Kuo, Zhiyong Li, Gary Gibson
Estimating the term…
According to an example, an apparatus for collecting a material to be spectrally analyzed includes a body having a first end and a second end, in which the body is elongated along a first axis from the first end to the second end. The body also includes a hole having an opening formed in an external surface of the body at a location between the first end and the second end and extending at least partially through the body at an angle with respect to the first axis. The body further includes a plurality of surface-enhanced spectroscopy (SES) elements positioned inside the body.
An apparatus for collecting a material to be spectrally analyzed, said apparatus comprising:
An apparatus for performing surface-enhanced spectroscopy (SES), said apparatus comprising:
A method for fabricating an apparatus for collecting material from an item of interest to be spectrally analyzed, the method comprising:
Dependencies are inferred from the claim text.