Scan chain in an integrated circuit

A scannable storage element for use in an Integrated Circuit (IC), the scannable storage element comprising:

• an input circuit configured to provide a first signal at a first node in response to one of a data input and a scan input, the scan input being of a pull-down logic in a functional mode, the input circuit comprising:
• a first pull-up path comprising a first switch to receive the scan input and a second switch to receive the data input;
• a second pull-up path comprising the first switch and a third switch to receive an inverted scan enable input, the first pull-up path and the second pull-up path coupled between a power supply and the first node;
• a first pull-down path comprising a fourth switch to receive the inverted scan enable input and a fifth switch to receive the data input;
• and
• a second pull-down path comprising a sixth switch to receive the scan input, the first pull-down path and the second pull-down path coupled between the first node and a reference supply;
• a shifting circuit coupled with the first node, the shifting circuit comprising one or more sequential components and configured to provide a second signal in response to the first signal at a second node;
• and
• a scan output buffer coupled to the second node to receive the second signal, the scan output buffer configured to provide a scan output at a scan output terminal in response to the second signal, wherein the scan output is one of the pull-up logic and the pull-down logic in the functional mode and the scan output corresponds to the scan input in a shift mode.

A method for operating a scannable storage element in a scan chain of an Integrated Circuit (IC), the method comprising:

• generating a first signal at a first node of the scannable storage element in response of one of a data input and a scan input, the scan input being one of a pull-up and a pull-down logic in a functional mode;
• generating a second signal by one or more sequential elements in response to the first signal at a second node of the scannable storage element;
• and
• generating a scan output at a scan output terminal of the scannable storage element in response to the second signal, wherein the scan output is one of a pull-up logic and a pull-down logic in the functional mode and the scan output corresponds to the scan input in a shift mode.