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US 2014/0208164 A1Published application
Scalable test platform
AssigneeLTX-Credence Corporation
InventorsWilliam A. Fritzsche, Jeffery D. Currin, Russell Elliott Poffenberger, Timothy Alton, Michael Gordon Davis
Life of this patent
Estimating the term…
Abstract
A scalable test platform includes a PCIe-based event fabric. One or more instrument subsystems are coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data. One or more digital signal processing subsystems are coupled to the PCIe-based event fabric and configured to process the captured test data
Claims20
A scalable test platform comprising:
- a PCIe-based event fabric;
- one or more instrument subsystems coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data;
- and
- one or more digital signal processing subsystems coupled to the PCIe-based event fabric and configured to process the captured test data.
1 more element
A scalable test platform comprising:
- a PCIe-based event fabric;
- one or more CPU subsystems coupled to the PCIe-based event fabric and configured to execute an automated test process;
- one or more instrument subsystems coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data, the one or more instrument subsystems including one or more direct memory access engines configured to allow the one or more instrument subsystems to read data from and/or write data to a remote memory system;
- and
- one or more digital signal processing subsystems coupled to the PCIe-based event fabric and configured to process the captured test data.
2 more elements
A scalable test platform comprising:
- a PCIe-based event fabric including a PCIe backplane and one or more PCIe switches;
- one or more instrument subsystems coupled to the PCIe-based event fabric and configured to interface one or more devices under test and generate captured test data;
- and
- one or more digital signal processing subsystems coupled to the PCIe-based event fabric and configured to process the captured test data, the one or more digital signal processing subsystems including one or more direct memory access engines configured to allow the one or more digital signal processing subsystems to read data from and/or write data to a remote memory system.
1 more element
Dependencies are inferred from the claim text.