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US 2014/0208161 A1Published application
Scalable test platform
AssigneeLTX-Credence Corporation
InventorsWilliam A. Fritzsche, Jeffery D. Currin, Russell Elliott Poffenberger, Timothy Alton, Michael Gordon Davis
Life of this patent
Estimating the term…
Abstract
A scalable test platform includes a PCIe-based event fabric. One or more CPU subsystems are coupled to the PCIe-based event fabric and configured to execute an automated test process. One or more instrument subsystems are coupled to the PCIe-based event fabric and configured to interface one or more devices under test.
Claims21
A scalable test platform comprising:
- a PCIe-based event fabric;
- one or more CPU subsystems coupled to the PCIe-based event fabric and configured to execute an automated test process;
- and
- one or more instrument subsystems coupled to the PCIe-based event fabric and configured to interface one or more devices under test.
1 more element
A scalable test platform comprising:
- a PCIe-based event fabric including a PCIe backplane and one or more PCIe switches;
- one or more CPU subsystems coupled to the PCIe-based event fabric and configured to execute an automated test process;
- and
- one or more instrument subsystems coupled to the PCIe-based event fabric and configured to interface one or more devices under test.
1 more element
A scalable test platform comprising:
- a PCIe-based event fabric including one or more PCIe switches;
- one or more CPU subsystems coupled to the PCIe-based event fabric and configured to execute an automated test process;
- and
- one or more instrument subsystems coupled to the PCIe-based event fabric and configured to interface one or more devices under test, the one or more instrument subsystems including:
- one or more direct memory access engines configured to allow the one or more instrument subsystems to read data from and/or write data to a remote memory system accessible by the one or more CPU subsystems.
2 more elements
Dependencies are inferred from the claim text.