Automated test platform
AssigneeLTX-Credence Corporation
InventorsWILLIAM A. FRITZSCHE, James Michael Jula, Timothy Alton, Russell Elliott Poffenberger, Michael E. Amy
Life of this patent
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Abstract
A segmented subsystem, for use within an automated test platform, includes a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment. A second subsystem segment includes a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.
Claims20
A segmented subsystem, for use within an automated test platform, comprising:
- a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment;
- and
- a second subsystem segment including a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.
A segmented subsystem, for use within an automated test platform, comprising:
- a first subsystem segment including:
- a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment, and
- a first DMA engine configured to allow the first subsystem segment to read data from and/or write data to a remote memory system;
- and
- a second subsystem segment including:
- a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment, and
- a second DMA engine configured to allow the second subsystem segment to read data from and/or write data to the remote memory system.
A segmented instrument subsystem, for use within an automated test platform, comprising:
- a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment;
- a second subsystem segment including a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment;
- instrument hardware configured to interface with one or more devices under test;
- and
- a PCIe interface configured to couple the segmented instrument subsystem with a PCIe-based event fabric.
Dependencies are inferred from the claim text.