Embedded tester
AssigneeTeradyne, Inc.
InventorJoshua Mason Ferry
Life of this patent
Estimating the term…
Abstract
A tester on a device under test to test component circuitry of the device under test, the tester comprising: logic configured with firmware to implement test circuitry comprising: protocol generators that are configurable to generate protocols; pattern generators that are configurable to provide test patterns that are drivable according to one or more of the protocols; and a system controller to select, in response to a program input, a test pattern and a protocol with which to test the component circuitry.
Claims20
A tester on a device under test to test component circuitry of the device under test, the tester comprising:
- logic configured with firmware to implement test circuitry comprising:
- protocol generators that are configurable to generate protocols;
- pattern generators that are configurable to provide test patterns that are drivable according to one or more of the protocols;
- and
- a system controller to select, in response to a program input, a test pattern and a protocol with which to test the component circuitry.
A method of configuring a tester on a device under test to test component circuitry of the device under test, the method comprising:
- configuring logic with firmware to implement test circuitry comprising:
- protocol generators that are configurable to generate protocols;
- pattern generators that are configurable to provide test patterns that are drivable according to one or more of the protocols;
- and
- a system controller to select, in response to a program input, a test pattern and a protocol with which to test the component circuitry.
One or more machine-readable media storing instructions that are executable to perform operations comprising:
- configuring logic with firmware to implement test circuitry comprising:
- protocol generators that are configurable to generate protocols;
- pattern generators that are configurable to provide test patterns that are drivable according to one or more of the protocols;
- and
- a system controller to select, in response to a program input, a test pattern and a protocol with which to test the component circuitry;
- wherein the test circuitry is part of a tester that is on a device under test, the tester for testing component circuitry of the device under test.
Dependencies are inferred from the claim text.