Apparatus for inspecting touch panel and method thereof
AssigneeSamsung Display Co., Ltd.
InventorJun-Young KO
Life of this patent
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Abstract
Disclosed herein is an apparatus for inspecting a touch panel and a method thereof, the apparatus includes: a capacitance measuring unit measuring capacitance value of a number of regions set on a touch panel, and a defect determining unit determining whether or not a specific region is defective, by comparing the capacitance value of the specific region with the capacitance value of an adjacent region. According to the present embodiments, a touch panel having an improved defect detection ability and a method thereof, by comparing with capacitance of regions adjacent to each other, are provided.
Claims20
An apparatus for inspecting a touch panel comprising,
- a capacitance measuring unit configured to measure a capacitance value of a plurality of regions of a touch panel;
- and
- a defect determining unit configured to determine whether or not a specific region is defective by comparing a capacitance value of the specific region with a capacitance value of an adjacent region.
A method of inspecting a touch panel comprising,
- measuring a capacitance value of a plurality of regions of a touch panel;
- and
- comparing the capacitance value in the specific region with the capacitance value in an adjacent region and determining whether or not the region is defective.
Dependencies are inferred from the claim text.