Measuring system

A Measuring system comprising:

• a magnetic field sensor array that has a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field vector in a first spatial direction, a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field vector in a second spatial direction, and a third magnetic field sensor integrated into a semiconductor chip for measuring a third component of the magnetic field vector in a third spatial direction;
• an encoder adapted to change the magnetic field vector in the first spatial direction and in the second spatial direction and in the third spatial direction as a function of a rotatory and/or translational movement, wherein the change, caused by the movement of the encoder, in the magnetic field vector describes a closed and non-intersecting line in all three spatial directions;
• and
• an evaluation circuit to which the first magnetic field sensor, the second magnetic field sensor and the third magnetic field sensor are connectable, the evaluation circuit being configured to determine a position of the encoder based on a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor and a third measurement signal of the third magnetic field sensor.