Measuring system

A measuring system comprising:

• a magnetic field sensor array that has a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field vector in a first spatial direction, a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field vector in a second spatial direction, and a third magnetic field sensor integrated into a semiconductor chip for measuring a third component of the magnetic field vector in a third spatial direction;
• an encoder configured to change the magnetic field vector in the first spatial direction and in the second spatial direction and in the third spatial direction as a function of a rotatory and/or translational movement, wherein the change, caused by the movement of the encoder in the magnetic field vector, has a first periodicity in the first spatial direction and in the second spatial direction, wherein the change, caused by the movement of the encoder in the magnetic field vector in the third spatial direction, has a second periodicity, wherein a first period of the first periodicity and a second period of the second periodicity are different;
• and
• an evaluation circuit to which the first magnetic field sensor and the second magnetic field sensor and the third magnetic field sensor are connectable, the evaluation circuit being adapted to determine a position of the encoder based on a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor and a third measurement signal of the third magnetic field sensor.