Current Probe, Current Probe Measurement System, and Current Probe Measurement Method
AssigneeHitachi, Ltd.
InventorsHiroki Funato, Takashi Suga
Life of this patent
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AssigneeHitachi, Ltd.
InventorsHiroki Funato, Takashi Suga
Estimating the term…
Provided is a current probe which reduces, in current measurement, a measurement error due to an unnecessary magnetic field generated from a subject not to be measured, said subject being adjacent to a subject to be measured. The current probe is characterized in having: a sensor that detects a magnetic field; a transmission path connected to the sensor; and a pair of conductive members, which protrude toward the front from a leading edge portion of the sensor, and are provided to face the sensor. The current probe is also characterized in that a front portion of the sensor, said portion being surrounded by the protruding portions of the conductive members, is opened in the direction of a plane that faces the conductive members.
A current probe comprising:
A current probe comprising:
A current probe measurement system comprising:
A current probe measurement method comprising:
Dependencies are inferred from the claim text.