Charged particle beam lens and exposure apparatus using the same
AssigneeCanon Kabushiki Kaisha
InventorsTakahisa Kato, Yutaka Setomoto
Life of this patent
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AssigneeCanon Kabushiki Kaisha
InventorsTakahisa Kato, Yutaka Setomoto
Estimating the term…
An electrostatic charged particle beam lens includes an electrode including a flat plate having a first surface having a normal line extending in a direction of an optical axis and a second surface opposite to the first surface, the electrode having a through-hole extending from the first surface to the second surface. When an opening cross section is defined as a cross section of the through-hole taken along a plane perpendicular to the normal line and a representative diameter is defined as a diameter of a circle obtained by performing regression analysis of the opening cross section, a representative diameter of the opening cross section in a first region that is on the first surface side and a representative diameter of the opening cross section in a second region that is on the second surface side are each larger than a representative diameter of the opening cross section in a third region that is a region in the electrode disposed between the first surface and the second surface.
An electrostatic charged particle beam lens comprising:
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Dependencies are inferred from the claim text.