Voltage testing device and method for power supply
AssigneesHon Hai Precision Industry Co., Ltd., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
InventorHAO HU
Life of this patent
Estimating the term…
Loading patent…
AssigneesHon Hai Precision Industry Co., Ltd., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
InventorHAO HU
Estimating the term…
The disclosure provides a voltage testing device and a method. The voltage testing method includes following steps. The computer sets initial setting parameters for an oscillograph. The computer receives initial testing parameters sent by the oscillograph, and sends a current voltage offset and a current voltage undulating value to the control unit according to the initial testing parameters. The oscillograph obtains voltage values of the power supply during a period of time, produces a voltage wave according to the voltage values, and sends the voltage wave and the voltage values to the computer. The computer displays the voltage wave and the voltage values to the computer.
A voltage testing device comprising:
A voltage testing method, applied in a voltage testing device, comprising:
Dependencies are inferred from the claim text.