Fault isolation with abstracted objects

A method comprising:

• receiving notification of a fault in a system having a plurality of chips;
• in response to the notification,
• serially analyzing each of a first plurality of clock objects for indications of faults captured in the system and, for each of the first plurality of clock objects with an indication of a captured fault, initiating a repair action defined for the captured fault and the chip of the plurality of chips represented by the clock object, wherein the first plurality of clock objects represent clock aspects of a first set of the plurality of chips;
• serially analyzing each of a second plurality of clock objects for indications of faults captured in the system and, for each of the second plurality of clock objects with an indication of a captured fault, initiating a repair action defined for the captured fault and the chip of the plurality of chips represented by the clock object, wherein the second plurality of clock objects represent non-clock aspects of a second set of the plurality of chips, wherein the first plurality of clock objects are serially analyzed prior to the second plurality of clock objects;
• and
• after analysis of the clock objects,
• concurrently analyzing non-clock objects for indications of captured faults,
• for each of the non-clock objects with an indication of a captured fault, initiating a repair action defined for the captured fault and for the chip represented by the non-clock object.

A computer program product for fault isolation, the computer program product comprising:

• a computer readable storage medium having computer usable program code embodied therewith, the computer usable program code comprising a computer usable program code configured to:
• generate, for each of a plurality of chips in a system, a clock object and a non-clock object, wherein the clock object indicates at least one of data and program code for clock related functionality of the chip and the non-clock object indicates at least one of data and program code for functionality of the chip that is not related to clock functionality;
• in response to a notification of a fault captured in the system,
• serially analyze each of the clock objects to determine captured faults associated with the clock objects;
• for each of the clock objects determined to have a captured fault, initiate a repair action for the chip represented by the clock object;
• and
• after analysis of the clock objects,
• concurrently analyze the non-clock objects to determine captured faults associated with the non-clock objects;
• for each of the non-clock objects determined to have a captured fault, initiate a repair action for the chip represented by the non-clock object.

An apparatus comprising:

• a plurality of chips;
• and
• a service processor configured to,
• generate, for each of the plurality of chips, a clock object and a non-clock object, wherein the clock object indicates at least one of data and program code for clock related functionality of the chip and the non-clock object indicates at least one of data and program code for functionality of the chip that is not related to clock functionality;
• in response to a notification of a fault captured in the apparatus,
• serially analyze each of the clock objects to determine captured faults associated with the clock objects;
• for each of the clock objects determined to have a captured fault, initiate a repair action for the chip represented by the clock object;
• and
• after analysis of the clock objects,
• concurrently analyze the non-clock objects to determine captured faults associated with the non-clock objects;
• for each of the non-clock objects determined to have a captured fault, initiate a repair action for the chip represented by the non-clock object.