Voltage testing device and method for memory
AssigneesHon Hai Precision Industry Co., Ltd., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
InventorHAO HU
Life of this patent
Estimating the term…
Loading patent…
AssigneesHon Hai Precision Industry Co., Ltd., HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
InventorHAO HU
Estimating the term…
The disclosure provides a voltage testing device and a method. The voltage testing method includes following steps. The computer sets initial setting parameters for an oscillograph and a signal producer. The signal producer sends an initial pulse signal to an input terminal of a memory. The computer receives initial testing parameters of an output terminal of the memory and the initial voltage value of the input terminal sent by the oscillograph, and sends a current voltage offset and a current voltage undulating value to the control unit. The computer sends a current voltage value to the signal producer. The signal producer sends a current pulse signal to the input terminal. The oscillograph obtaining voltage values of the input and output terminals, produces two voltage waves, and sends the two voltage waves and the voltage values to the computer. The computer displays the two voltage waves and the voltage values.
A voltage testing device comprising:
A voltage testing method, applied in a voltage testing device, comprising:
Dependencies are inferred from the claim text.