Systems and methods for statistical measurement control of spectrophotometric data
AssigneePPG Industries Ohio, Inc.
InventorAlison M. Norris
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Abstract
A computer implemented method. The method includes obtaining, using a processor, spectral reflectance data from a coated surface having a target coating theron; and determining, using the processor, whether the data includes any outlier data points. The method also includes removing, using the processor, at least one of the outlier data points to produce final spectral reflectance data; and calculating, using the processor, a characteristic of the target coating based at least in part on the final spectral reflectance data.
Claims13
A computer implemented method, comprising:
- obtaining, using a processor, spectral reflectance data from a coated surface having a target coating theron;
- determining, using the processor, whether the data includes any outlier data points;
- removing, using the processor, at least one of the outlier data points to produce final spectral reflectance data;
- and
- calculating, using the processor, a characteristic of the target coating based at least in part on the final spectral reflectance data.
An apparatus, comprising:
- means for obtaining spectral reflectance data from a coated surface having a target coating theron;
- means for determining whether the data includes any outlier data points;
- means for removing at least one of the outlier data points to produce final spectral reflectance data;
- and
- means for calculating a characteristic of the target coating based at least in part on the final spectral reflectance data.
A non-transitory computer readable medium including software for causing a processor to:
- obtain spectral reflectance data from a coated surface having a target coating theron;
- determine whether the data includes any outlier data points;
- remove at least one of the outlier data points to produce final spectral reflectance data;
- and
- calculate a characteristic of the target coating based at least in part on the final spectral reflectance data.
Dependencies are inferred from the claim text.