Test partitioning for a non-volatile memory

A method of testing non-volatile memory, comprising:

• erasing a portion of a non-volatile memory;
• programming a test pattern to a sub-portion of the erased portion;
• performing a read operation on the sub-portion;
• and
• determining whether the read operation produces the test pattern.

A method of preparing an electronic device for shipment, the electronic device comprising a non-volatile memory, the method comprising:

• creating first and second virtual partitions of the non-volatile memory;
• testing the second virtual partition, the testing further comprising:
• erasing a portion of a non-volatile memory;
• programming a test pattern to a sub-portion of the erased portion;
• performing a read operation on the sub-portion;
• and
• determining whether the read operation produces the test pattern;
• storing results of the testing in the first virtual partition;
• and
• removing the virtual partitions before shipment of the electronic device.

An electronic device comprising:

• a non-volatile memory;
• and
• control circuitry operative to:
• erase a portion of a non-volatile memory;
• program a test pattern to a sub-portion of the erased portion;
• perform a read operation on the sub-portion;
• and
• determine whether the read operation produces the test pattern.